Article in Journal ART-2009-23

BibliographyHolst, Stefan; Wunderlich, Hans-Joachim: Adaptive Debug and Diagnosis Without Fault Dictionaries.
In: Journal of Electronic Testing - Theory and Applications (JETTA); August 2009. Vol. 25(4-5).
University of Stuttgart, Faculty of Computer Science, Electrical Engineering, and Information Technology.
pp. 259-268, english.
Springer Netherlands, August 2009.
ISSN: 0923-8174; DOI: 10.1007/s10836-009-5109-3.
Article in Journal.
CR-SchemaB.8.1 (Reliability, Testing, and Fault-Tolerance)
KeywordsDiagnosis; Debug; Test; VLSI
Abstract

Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the pre-silicon development process. For recent process technologies, defect mechanisms are increasingly complex, and continuous efforts are made to model these defects by using sophisticated fault models. Traditional static approaches for debug and diagnosis with a simplified fault model are more and more limited. In this paper, a method is presented, which identifies possible faulty regions in a combinational circuit, based on its input/output behavior and independent of a fault model. The new adaptive, statistical approach is named POINTER for 'Partially Overlapping Impact couNTER' and combines a flexible and powerful effect-cause pattern analysis algorithm with high-resolution ATPG. We show the effectiveness of the approach through experiments with benchmark and industrial circuits. In addition, even without additional patterns this analysis method provides good resolution for volume diagnosis, too.

CopyrightSpringer Science + Business Media, LLC 2009
Department(s)University of Stuttgart, Institute of Technical Computer Science, Computer Architecture
Project(s)DIADEM
Entry dateDecember 2, 2009
   Publ. Computer Science