Other Paper INMISC-2009-07

BibliographyHolst, Stefan; Wunderlich, Hans-Joachim: Diagnose mit extrem kompaktierten Fehlerdaten.
In: 21. ITG/GI/GMM Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"; Bremen, Germany; February 15-17, 2009.
University of Stuttgart, Faculty of Computer Science, Electrical Engineering, and Information Technology.
pp. 15-20, german.
ITG/GI/GMM Workshop, February 2009.
Other Paper.
CorporationITG/GI/GMM Workshop
CR-SchemaB.8.1 (Reliability, Testing, and Fault-Tolerance)
KeywordsDiagnose; eingebettete Diagnose; Multi–site–Test; Kompaktierung; Design-for-Test
Department(s)University of Stuttgart, Institute of Technical Computer Science, Computer Architecture
Project(s)DIADEM
Entry dateMarch 12, 2010
   Publ. Computer Science