Artikel in Tagungsband INPROC-1998-39

Bibliograph.
Daten
Yarmolik, Vyacheslav N.; Klimets, Yuri; Hellebrand, Sybille; Wunderlich, Hans-Joachim: New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.
In: Proceedings of Design & Diagnostics of Electronic Circuits & Systems (DDECS), Szczyrk, Poland, September 1998.
Universität Stuttgart, Fakultät Informatik.
S. 27-33, englisch.
Gliwice: Silesian Techn. Univ. Press, September 1998.
ISBN: 83-90840-96-0.
Artikel in Tagungsband (Konferenz-Beitrag).
CR-Klassif.B.8.1 (Reliability, Testing, and Fault-Tolerance)
Kurzfassung

The new memory transparent BIST technique is proposed in this paper. It has more higher fault coverage compare to classical transparent technique. Also this technique decreases the test complexity up to 50% for the most of march tests.

Abteilung(en)Universität Stuttgart, Institut für Informatik, Rechnerarchitektur
Eingabedatum16. April 2008
   Publ. Informatik