Article in Proceedings INPROC-2001-42

BibliographyKessler, Michael; Kiefer, Gundolf; Leenstra, Jens; Schünemann, Knut; Schwarz, Thomas; Wunderlich, Hans-Joachim: Using a Hierarchical DfT Methodology in High Frequency Processor Designs for Improved Delay Fault Testability.
In: Proceedings of the International Test Conference : ITC 2001 ; Baltimore, Maryland, October 30-November 1, 2001.
University of Stuttgart, Faculty of Computer Science.
pp. 461-469, english.
IEEE Computer Society Press, October 30, 2001.
ISBN: 0-7803-7169-0.
Article in Proceedings (Conference Paper).
CorporationInternational Test Conference
CR-SchemaB.8.1 (Reliability, Testing, and Fault-Tolerance)
C.1 (Processor Architectures)
C.4 (Performance of Systems)
Keywordshierarchical; DfT; BIST; testability; scan chain reordering
Abstract

In this paper a novel hierarchical DfT methodology is presented which is targeted to improve the delay fault testability for external testing and scan-based BIST. After the partitioning of the design into high frequency macros, the analysis for delay fault testability already starts in parallel with the implementation at the macro level. A specification is generated for each macro that defines the delay fault testing characteristics at the macro boundaries. This specification is used to analyse and improve the delay fault testability by improving the scan chain ordering at macro-level before the macros are connected together into the total chip network. The hierarchical methodology has been evaluated with the instruction window buffer core of an out-of-order processor. It was shown that for this design practically no extra hardware is required.

Department(s)University of Stuttgart, Institute of Parallel and Distributed High-Performance Systems, Applications of Parallel and Distributed Systems
University of Stuttgart, Institute of Computer Science, Computer Architecture
Entry dateNovember 13, 2001
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