Bibliography | Holst, Stefan; Wunderlich, Hans-Joachim: A diagnosis algorithm for extreme space compaction. In: European Design and Automation Association (ed.): Design, Automation and Test in Europe (DATE'09); Nice; France; April 20-24, 2009. University of Stuttgart, Faculty of Computer Science, Electrical Engineering, and Information Technology. IEEE Catalog Number; CFP09162-DVD, pp. 1355-1360, english. IEEE Xplore, April 2009. ISBN: 978-1-4244-3781-8; ISSN: 1530-1591; ieee: 5090875. Article in Proceedings (Conference Paper).
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Corporation | Design, Automation and Test in Europe |
CR-Schema | B.8.1 (Reliability, Testing, and Fault-Tolerance)
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Keywords | Compaction; Design-for-test; Diagnosis; Embedded diagnosis; Multi-site test |
Abstract | During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including built-in self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which are especially suited for BIST and multi-site testing. The experimental results on industrial designs show, that test time and response data volume reduces significantly and the diagnostic resolution even improves with this scheme. A comparison with X-Compact shows, that simple parity information provides higher diagnostic resolution per response data bit than more complex signatures.
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Full text and other links | ieee: 5090875
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Copyright | 2009 by EDAA |
Department(s) | University of Stuttgart, Institute of Technical Computer Science, Computer Architecture
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Project(s) | DIADEM
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Entry date | July 8, 2009 |
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