@inproceedings {INPROC-1996-22,
    author = {Hans-Joachim Wunderlich and Gundolf Kiefer},
    title = {{Bit-Flipping BIST}},
    booktitle = {Proceedings of the ACM/IEEE International Conference on CAD-96 (ICCAD), San Jose, CA, November 1996},
    publisher = {Institute of Electrical and Electronics Engineers},
    institution = {Universit{\"a}t Stuttgart, Fakult{\"a}t Informatik, Germany},
    pages = {337--343},
    type = {Konferenz-Beitrag},
    month = {November},
    year = {1996},
    isbn = {0-8186-7597-7},
    issn = {1063-6757},
    doi = {10.1109/ICCAD.1996.569803},
    keywords = {Mixed-Mode BIST},
    language = {Englisch},
    cr-category = {B.8.1 Reliability, Testing, and Fault-Tolerance},
    department = {Universit{\"a}t Stuttgart, Institut f{\"u}r Informatik, Rechnerarchitektur},
    abstract = {A scan-based BIST scheme is presented which guarantees complete fault coverage
      with very low hardware overhead. A probabilistic analysis shows that the output
      of an LFSR which feeds a scan path has to be modified only at a few bits in
      order to transform the random patterns into a complete test set. These
      modifications may be implemented by a bit-flipping function which has the
      LFSR-state as an input, and flips the value shifted into the scan path at
      certain times. A procedure is described for synthesizing the additional
      bit-flipping circuitry, and the experimental results indicate that this
      mixed-mode BIST scheme requires less hardware for complete fault coverage than
      all the other scan-based BIST approaches published so far.},
    url = {http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=INPROC-1996-22&engl=0}
 }