Diploma Thesis DIP-2012-21

BibliographyPan, Yali: Simulationsgestützte Fehleranalyse bildbasierter Messverfahren zur Bestimmung von Partikeleigenschaften.
University of Stuttgart, Faculty of Computer Science, Electrical Engineering, and Information Technology, Diploma Thesis No. 21 (2012).
77 pages, english.

kein Abstract.

Department(s)University of Stuttgart, Institute of Parallel and Distributed Systems, Parallel Systems
Superviser(s)Simon, Prof. Sven; Rockstroh, Lars
Entry dateJune 12, 2019
   Publ. Computer Science