B. Hardware

• B.0 GENERAL
• B.1 CONTROL STRUCTURES AND MICROPROGRAMMING (see also D.3.2)
  • B.1.0 General
  • B.1.1 Control Design Styles
    • Hardwired control (retired since 1998)
    • Microprogrammed logic arrays (retired since 1998)
    • Writable control store (retired since 1998)
  • B.1.2 Control Structure Performance Analysis and Design Aids
    • Automatic synthesis (retired since 1998)
    • Formal models (retired since 1998)
    • Simulation (retired since 1998)
  • B.1.3 Control Structure Reliability, Testing, and Fault-Tolerance (retired since 1998) (see also B.8)
    • Diagnostics (retired since 1998)
    • Error-checking (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
  • B.1.4 Microprogram Design Aids (see also D.2.2, D.2.4, D.3.2, D.3.4)
    • Firmware engineering (retired since 1998)
    • Languages and compilers
    • Machine-independent microcode generation (retired since 1998)
    • Optimization (retired since 1998)
    • Verification (retired since 1998)
  • B.1.5 Microcode Applications
    • Direct data manipulation (retired since 1998)
    • Firmware support of operating systems/instruction sets (retired since 1998)
    • Instruction set interpretation
    • Peripheral control (retired since 1998)
    • Special-purpose (retired since 1998)
  • B.1.m Miscellaneous
• B.2 ARITHMETIC AND LOGIC STRUCTURES
  • B.2.0 General
  • B.2.1 Design Styles (see also C.1.1, C.1.2)
    • Calculator (retired since 1998)
    • Parallel
    • Pipeline
  • B.2.2 Performance Analysis and Design Aids (retired since 1998) (see also B.8)
    • Simulation (retired since 1998)
    • Verification (retired since 1998)
    • Worst-case analysis (retired since 1998)
  • B.2.3 Reliability, Testing, and Fault-Tolerance (retired since 1998) (see also B.8)
    • Diagnostics (retired since 1998)
    • Error-checking (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
  • B.2.4 High-Speed Arithmetic (new)
    • Algorithms (new)
    • Cost/performance (new)
  • B.2.m Miscellaneous
• B.3 MEMORY STRUCTURES
  • B.3.0 General
  • B.3.1 Semiconductor Memories (new) (see also B.7.1)
    • Dynamic memory (DRAM) (new)
    • Read-only memory (ROM) (new)
    • Static memory (SRAM) (new)
  • B.3.2 Design Styles (see also D.4.2)
    • Associative memories
    • Cache memories
    • Interleaved memories (retired since 1998)
    • Mass storage (e.g., magnetic, optical, RAID) (revised 1998)
    • Primary memory
    • Sequential-access memory (retired since 1998)
    • Shared memory
    • Virtual memory
  • B.3.3 Performance Analysis and Design Aids (retired since 1998) (see also B.8, C.4)
    • Formal models (retired since 1998)
    • Simulation (retired since 1998)
    • Worst-case analysis (retired since 1998)
  • B.3.4 Reliability, Testing, and Fault-Tolerance (retired since 1998) (see also B.8)
    • Diagnostics (retired since 1998)
    • Error-checking (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
  • B.3.m Miscellaneous
• B.4 INPUT/OUTPUT AND DATA COMMUNICATIONS
  • B.4.0 General
  • B.4.1 Data Communications Devices
    • Processors (retired since 1998)
    • Receivers (e.g., voice, data, image) (retired since 1998)
    • Transmitters (retired since 1998)
  • B.4.2 Input/Output Devices
    • Channels and controllers
    • Data terminals and printers
    • Image display
    • Voice
  • B.4.3 Interconnections (Subsystems)
    • Asynchronous/synchronous operation
    • Fiber optics
    • Interfaces
    • Parallel I/O (new)
    • Physical structures (e.g., backplanes, cables, chip carriers) (retired since 1998)
    • Topology (e.g., bus, point-to-point)
  • B.4.4 Performance Analysis and Design Aids (retired since 1998) (see also B.8)
    • Formal models (retired since 1998)
    • Simulation (retired since 1998)
    • Verification (retired since 1998)
    • Worst-case analysis (retired since 1998)
  • B.4.5 Reliability, Testing, and Fault-Tolerance (retired since 1998) (see also B.8)
    • Built-in tests (retired since 1998)
    • Diagnostics (retired since 1998)
    • Error-checking (retired since 1998)
    • Hardware reliability (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
  • B.4.m Miscellaneous
• B.5 REGISTER-TRANSFER-LEVEL IMPLEMENTATION
  • B.5.0 General
  • B.5.1 Design
    • Arithmetic and logic units
    • Control design
    • Data-path design
    • Memory design
    • Styles (e.g., parallel, pipeline, special-purpose)
  • B.5.2 Design Aids
    • Automatic synthesis (retired since 1998)
    • Hardware description languages
    • Optimization (retired since 1998)
    • Simulation (retired since 1998)
    • Verification (retired since 1998)
  • B.5.3 Reliability and Testing (retired since 1998) (see also B.8)
    • Built-in tests (retired since 1998)
    • Error-checking (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
    • Testability (retired since 1998)
  • B.5.m Miscellaneous
• B.6 LOGIC DESIGN
  • B.6.0 General
  • B.6.1 Design Styles
    • Cellular arrays and automata
    • Combinational logic
    • Logic arrays
    • Memory control and access (retired since 1998)
    • Memory used as logic (retired since 1998)
    • Parallel circuits
    • Sequential circuits
  • B.6.2 Reliability and Testing (retired since 1998) (see also B.8)
    • Built-in tests (retired since 1998)
    • Error-checking (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
    • Testability (retired since 1998)
  • B.6.3 Design Aids
    • Automatic synthesis (retired since 1998)
    • Hardware description languages
    • Optimization (retired since 1998)
    • Simulation (retired since 1998)
    • Switching theory
    • Verification (retired since 1998)
  • B.6.m Miscellaneous
• B.7 INTEGRATED CIRCUITS
  • B.7.0 General
  • B.7.1 Types and Design Styles
    • Advanced technologies
    • Algorithms implemented in hardware
    • Gate arrays
    • Input/output circuits
    • Memory technologies
    • Microprocessors and microcomputers
    • Standard cells (retired since 1998)
    • VLSI (very large scale integration)
  • B.7.2 Design Aids
    • Graphics
    • Layout
    • Placement and routing
    • Simulation (retired since 1998)
    • Verification (retired since 1998)
  • B.7.3 Reliability and Testing (retired since 1998) (see also B.8)
    • Built-in tests (retired since 1998)
    • Error-checking (retired since 1998)
    • Redundant design (retired since 1998)
    • Test generation (retired since 1998)
    • Testability (retired since 1998)
  • B.7.m Miscellaneous
• B.8 PERFORMANCE AND RELIABILITY (new) (see also C.4)
  • B.8.0 General (new)
  • B.8.1 Reliability, Testing, and Fault-Tolerance (new)
  • B.8.2 Performance Analysis and Design Aids (new)
  • B.8.m Miscellaneous (new)
• B.m MISCELLANEOUS
  • Design management